Design Automation Method for Total Ionization Dose Tolerant Integrated Circuits
نویسندگان
چکیده
Modern integrated circuits (IC) operate in environment of various destabilizing factors which have essential influence on the operation of these circuits and often even disturb the normal operation. One of these destabilizing factors is the cosmic radiation, particularly total ionization dose effects (TID). For modern TID tolerant ICs [1-4] design is being done by circuit designers. In this paper an automation method is suggested which allows to replace transistors in layout with appropriate TID tolerant devices, where it is needed to have high tolerance from TID effects. This method allows design of TID tolerant IC layout by a design tool bringing to minimum circuit designer participation in layout design process.
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